Home > Product lineup  > Semiconductor Testing Equipment

This system simulates the operating characteristics of the production circuit.

  • This system is powerful for collecting and analyzing the operation parameters of the protection circuit assembled in the integrated circuit. This is effective for verifying the ESD resistance in the HBM/CDM test. This system is equipped with cutting edge test modes. These test modes include the normal mode with a 100ms/200ms application pulse width and the VFTLP (Very Fast TLP) mode which has an application width of just 1ns.
    The incident wave to the device pin, and the wave reflected from the device can be confirmed with the standard oscilloscope.

  • The positive direction and negative direction can both be evaluated independently by inputting the rectangular wave to the I/O terminal.

  • Portable, non-contact electrostatic imaging system with an integrated area sensor, which enables you to monitor electrostatic charge in real time.

Company profile